Thomas Everhart
| Thomas Eugene Everhart | |
|---|---|
| Born |
February 15, 1932 Kansas City, Missouri, United States |
| Citizenship | United States |
| Fields | Electrical Engineering, Applied Physics |
| Institutions | University of California, Berkeley, Cornell University, University of Illinois at Urbana-Champaign, California Institute of Technology, University of Cambridge |
| Alma mater | Harvard College, University of California, Los Angeles, University of Cambridge |
| Notable awards |
IEEE Centennial Medal (1984) Clark Kerr Award (1992) ASEE Centennial Medallion (1993) IEEE Founders Medal (2002) Okawa Prize (2002) |
Thomas Eugene Everhart FREng (born February 15, 1932, Kansas City, Missouri) is an American educator and physicist. His area of expertise is the physics of electron beams. Together with Richard F. M. Thornley he designed the Everhart-Thornley detector. These detectors are still in use in scanning electron microscopes, even though the first such detector was made available as early as 1956.
Everhart was elected to the National Academy of Engineering in 1978. He was appointed an International Fellow of the Royal Academy of Engineering in 1990. He served as Chancellor of the University of Illinois at Urbana-Champaign from 1984 to 1987 and as the President of the California Institute of Technology from 1987 to 1997.
Everhart's parents were William E. Everhart and Elizabeth A. West. Everhart received his A.B. in Physics from Harvard University in 1953, and his M.S. in Applied Physics from the University of California, Los Angeles in 1955. He held a Marshall Scholarship at Clare College University of Cambridge where he completed a PhD in Physics under Professor Charles Oatley in 1958.
Everhart began working on electron detection and the design of scanning electron microscopes (SEMs) as a student with Charles Oatley at Cambridge in 1955. An initial prototype, the SEM1, had been developed by Dennis McMullen, who published his dissertation Investigations relating to the design of electron microscopes in 1952. It was further modified by Ken C. A. Smith, who developed a way to efficiently detect low-energy secondary electrons. Oatley and his students used SEM to develop a variety of new techniques for studying surface topography.
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