Alan S. Kaufman | |
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Born | April 1944 (age 72) Brooklyn |
Citizenship | American |
Fields | Psychometrics |
Institutions | Yale University Child Study Center |
Alma mater | University of Pennsylvania, Columbia University |
Doctoral advisor | Robert Thorndike |
Doctoral students | Cecil Reynolds, Jack Naglieri, Bruce Bracken, Randy Kamphaus, Toshinori Ishikuma |
Known for | Kaufman Assessment Battery for Children |
Alan S. Kaufman (born April 1944) is an American psychology professor known for his work on intelligence testing.
Born in Brooklyn and raised on Long Island, Kaufman earned his bachelor's degree from the University of Pennsylvania in 1965; M.A. in Educational Psychology from Columbia University in 1967; and Ph.D. from Columbia University in 1970 (under Robert L. Thorndike), specializing in psychometrics.
He has been married to psychologist Nadeen L. Kaufman since 1964. While Assistant Director at The Psychological Corporation from 1968 to 1974, he worked closely with David Wechsler on the revision of the Wechsler Intelligence Scale for Children (WISC) and supervised the standardization of the revised version (WISC-R). He also collaborated with Dorothea McCarthy in the development and standardization of the McCarthy Scales of Children’s Abilities. He held positions at University of Georgia (1974–1979) and University of Alabama (1984–1995) before taking a position at Yale University.
Both have been at Yale University's Child Study Center in the School of Medicine since 1997.
The research team that Kaufman and his wife supervised while at the University of Georgia in 1978-79 developed the original Kaufman Assessment Battery for Children (K-ABC) and several other psychological and educational tests, including the Kaufman Test of Educational Achievement (K-TEA/NU), Kaufman Brief Intelligence Test (K-BIT), and the second editions of both ( KTEA-II and KBIT-2). The Kaufman Survey of Early Academic and Language Skills (K-SEALS) and the Cognitive/Language Profile of the Early Screening Profiles address the preschool level. The Kaufman Adolescent and Adult Intelligence Test (KAIT), the Kaufman Short Neuropsychological Assessment Procedure (K-SNAP), and the Kaufman Functional Academic Skills Test (K-FAST) extend through the adult life span.